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Visualisation to Support Fault Localisation in Distributed Embedded Systems within the Automotive Industry

Conference paper
Authors Francisco Gomes de Oliveira Neto
Michael Jones
Rafael da Silva Martins
Published in 2018 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)
ISBN 978-1-5386-9443-5
Publisher IEEE
Publication year 2018
Published at Institutionen för data- och informationsteknik, Software Engineering (GU)
Language en
Keywords Data visualization, Testing, Automotive engineering, Embedded systems,
Subject categories Software Engineering


This paper presents the design, development and evaluation of a software tool to assist the localisation of root causes of test case failures in distributed embedded systems, specifically vehicle systems controlled by a network of electronic control units (ECUs). We use data visualising to provide sensible information from a large number of test execution logs from large-scale software integration testing under a continuous integration process. Our goal is to allow more efficient root-cause identification of failures and foster a continuous feedback loop in the fault localisation process. We evaluate our solution in-situ at the Research and Development division of Volvo Car Corporation (VCC). Our prototype helps the failure debugging procedures by presenting clear and concise data and by allowing stakeholders to filter and control which information is displayed. Moreover, it encourages a systematic and continuous analysis of the current state of testing by aggregating and categorising historical data from test harnesses to identify patterns and trends in test results.

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